Catalog

ICL’s Basics™ Horizontal ATR is a high performance accessory that is easy on your lab budget. In its standard configuration the sample is placed into a large trough sample area that can be used for analysis of liquids, pastes, films and powders. Sample preparation is minimal. You simply place your sample into the easily removable top plate so that it sits in the trough above the ATR crystal. An 80 x 10 x 4mm ZnSe crystal is standard, but Ge is available as an option.

This new single reflection Horizontal ATR has the highest energy throughput of any ATR accessory on the market today.The energy throughput exceeds 85% and is made possible by coating the ZnSe prism with an efficient broadband anti-reflective coating and by the single reflection prism design. Samples are easy to deposit on the top surface of the ZnSe prism which is mounted horizontally in a stainless steel top plate which is easy to clean. The High Energy HATR enables qualitative and quantitative sampling of most routine samples, such as pastes, liquids and flexible solids. The accessory incorporates Constant Purge™ for uninterrupted system purge. Crystals are easily removed for cleaning and reconditioning. A pressure applicator is included for solid samples. Has 45° specular reflection stage.

Available options include a trough plate, a flow through liquid cell, a temperature controlled liquid cell and a reactor. The reactor is heatable to 250° C and can be pressurized to 800 psi. ZnS and Ge crystal prisms are also available as an option.

The Split Pea™ Hemi Micro ATR Sampler has the smallest sampling area of any ATR accessory. The hemispherical optic design is well matched to the refractive indices of the crystal materials and results in concentration of the beam by a factor equal to the refractive index of the material (3.4 for Si and 2.4 for diamond), thereby minimizing stray light and shrinking the sample area. The small sample area – 250 µm for a Si crystal and 500 µm for a diamond crystal – translates into easier alignment of small samples in the beam and the ability to apply localized pressure to the sample thereby improving contact between the sample and the crystal at high pressures. Furthermore, the hemispheric optics do not cause the beam to defocus after it strikes the sample as occurs with conventional prisms used in internal reflection spectroscopy. (see Diagram) The result is enhanced spectral resolution with small and irregular samples.